UNE-EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
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UNE-EN 60749-23:2005
Standard No.
UNE-EN 60749-23:2005
Release Date
2005
Published By
AENOR
Status
Be replaced
2011-12
Replace By
UNE-EN 60749-23:2005/A1:2011
Latest
UNE-EN 60749-23:2005/A1:2011
UNE-EN 60749-23:2005 history
2011
UNE-EN 60749-23:2005/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
2005
UNE-EN 60749-23:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
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