GB/T 8446.2-2022 Heat sinks for power semiconductor devices—Part 2: Measurement methods of thermal resistance and inlet-outlet fluid pressure drop (English Version)
This document gives the terms and definitions and measurement methods of thermal resistance and flow resistance of heat sinks for power semiconductor devices. This document is applicable to the measurement of thermal resistance and flow resistance of heat sinks (including cast, extruded, profiled and heat pipe heat sinks) for power semiconductor devices.
GB/T 8446.2-2022 Referenced Document
GB/T 8446.1-2022 Heat sinks for power semiconductor devices—Part 1: Radiators
GB/T 8446.2-2022 history
2022GB/T 8446.2-2022 Heat sinks for power semiconductor devices—Part 2: Measurement methods of thermal resistance and inlet-outlet fluid pressure drop
2004GB/T 8446.2-2004 Heat sink for power semiconductor device Part 2:Measuring method of thermal resistance and input fluid-output fluid pressure difference
1987GB/T 8446.2-1987 Measuring method of thermal resistance and input fluid-output fluid pressure difference of heat sink for power semiconductor device