IEC 60749-15:2020 RLV Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
2010IEC 60749-15:2010 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
2003IEC 60749-15:2003 Semiconductor devices Mechanical and climatic test methods Part 15: Resistance to soldering temperature for through-hole mounted devices (Edition 1.0; Replaces IEC/PAS 62174: 2000; Together with IEC 60749-14:2003@ IEC 60749-3:2002 And IEC 60749-31:200