KS L 1619-2013(2018)
Testing methods for resistivity of conductive fine ceramic thin films with four point probe array

Standard No.

KS L 1619-2013(2018)

Release Date

2013

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS L 1619-2013(2023)

Latest

KS L 1619-2013(2023)

KS L 1619-2013(2018) history

• 0000 KS L 1619-2013(2023)
• 0000 KS L 1619-2013(2018)
• 2013 KS L 1619-2013 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
• 2003 KS L 1619-2003 Test methods for measuring resistivity of electrically conductive ceramic thin films with four point probe method