KS C IEC 60749-10-2020
Semiconductor devices — Mechanical and climatic test methods — Part 10: Mechanical shock

Standard No.

KS C IEC 60749-10-2020

Release Date

2020

Published By

KR-KS

Latest

KS C IEC 60749-10-2020

KS C IEC 60749-10-2020 history

• 2020 KS C IEC 60749-10:2020 Semiconductor devices — Mechanical and climatic test methods — Part 10: Mechanical shock
• 2004 KS C IEC 60749-10:2004 Semiconductor devices－Mechanical and climatic test methods－Part 10：Mechanical shock