KS C IEC 60749-2-2020
Semiconductor devices — Mechanical and climatic test methods — Part 2: Low air pressure
Home
KS C IEC 60749-2-2020
Standard No.
KS C IEC 60749-2-2020
Release Date
2020
Published By
KR-KS
Latest
KS C IEC 60749-2-2020
KS C IEC 60749-2-2020 history
2020
KS C IEC 60749-2:2020
Semiconductor devices — Mechanical and climatic test methods — Part 2: Low air pressure
2004
KS C IEC 60749-2:2004
Semiconductor devices-Mechanical and climatic test methods-Part 2:Low air pressure
Copyright ©2023 All Rights Reserved