YS/T 679-2018
Surface photovoltage method for measuring minority carrier diffusion length in extrinsic semiconductors (English Version)

Standard No.

YS/T 679-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

工业和信息化部

Latest

YS/T 679-2018

Replace

YS/T 679-2008

YS/T 679-2018 history

• 2018 YS/T 679-2018 Surface photovoltage method for measuring minority carrier diffusion length in extrinsic semiconductors
• 2008 YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-state surface photovoltage