DS/ISO 3274:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of consecutive profile transformation. Contact profile meters, system M
This International Standard defines the basic terms relating to system M profile meters, gives the basic parameters of these instruments and their numerical values and specifies their metrological characteristics.
NOTE — Similar International Standards relating to profile meters in other reference systems that may be accepted in future will be considered separately.
DS/ISO 3274:1981 history
1981DS/ISO 3274:1981 Instruments for the measurement of surface roughness by the profile method. Contact (stylus) instruments of consecutive profile transformation. Contact profile meters, system M