LST EN IEC 60749-20:2020
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020)

Standard No.

LST EN IEC 60749-20:2020

Release Date

2020

Published By

Lithuanian Standards Office

Status

Be replaced

Replace By

LST EN 60749-20-2010:2010

Latest

LST EN 60749-20-2010:2010

LST EN IEC 60749-20:2020 history

• 2020 LST EN IEC 60749-20:2020 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2020)
• 0000 LST EN 60749-20-2010:2010