LST EN IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020)

Standard No.

LST EN IEC 60749-41:2020

Release Date

2020

Published By

Lithuanian Standards Office

Latest

LST EN IEC 60749-41:2020

LST EN IEC 60749-41:2020 history

• 2020 LST EN IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (IEC 60749-41:2020)