LST EN IEC 60749-30:2020
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020)

Standard No.

LST EN IEC 60749-30:2020

Release Date

2020

Published By

Lithuanian Standards Office

Latest

LST EN IEC 60749-30:2020

Replace By

LST EN 60749-30-2005/A1-2011:2011 LST EN 60749-30-2005:2005

LST EN IEC 60749-30:2020 history

• 2020 LST EN IEC 60749-30:2020 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020)