OVE EN IEC 60749-37:2020
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV) (english version)

Standard No.

OVE EN IEC 60749-37:2020

Release Date

2020

Published By

AT-OVE/ON

Latest

OVE EN IEC 60749-37:2020

OVE EN IEC 60749-37:2020 history

• 2020 OVE EN IEC 60749-37:2020 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV) (english version)