OVE EN IEC 60749-10:2021
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (IEC 47/2692/CDV) (english version)

Standard No.

OVE EN IEC 60749-10:2021

Release Date

2021

Published By

AT-OVE/ON

Latest

OVE EN IEC 60749-10:2021

OVE EN IEC 60749-10:2021 history

• 2021 OVE EN IEC 60749-10:2021 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (IEC 47/2692/CDV) (english version)