ISO 18257:2016
Space systems - Semiconductor integrated circuits for space applications - Design requirements
- Standard No.
- ISO 18257:2016
- Release Date
- 2016
- Published By
- International Organization for Standardization (ISO)
- Latest
- ISO 18257:2016
- Scope
- This document specifies the basic design requirements for semiconductor ICs for space applications, includingits design process, as well as required tasks and requirements ofeach stage. Requirements of specific circuit design are not included.
ISO 18257:2016 Referenced Document
- IEC 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
- IEC 62132 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method
- IEC 62215-3:2013 Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
- ISO 10795:2011 Space systems - Programme management and quality - Vocabulary
ISO 18257:2016 history
- 2016 ISO 18257:2016 Space systems - Semiconductor integrated circuits for space applications - Design requirements
