PNS IEC 60749-44:2021
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

Standard No.

PNS IEC 60749-44:2021

Release Date

2021

Published By

PH-BPS

Latest

PNS IEC 60749-44:2021

PNS IEC 60749-44:2021 history

• 2021 PNS IEC 60749-44:2021 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices