PNS IEC 60749-28:2021
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

Standard No.

PNS IEC 60749-28:2021

Release Date

2021

Published By

PH-BPS

Latest

PNS IEC 60749-28:2021

PNS IEC 60749-28:2021 history

• 2021 PNS IEC 60749-28:2021 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level