IEC 63185:2020
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

Standard No.

IEC 63185:2020

Release Date

2020

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 63185:2020

Replace By

IEC 46F/523/FDIS:2020

Scope

This document relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuit

IEC 63185:2020 history

• 2020 IEC 63185:2020 Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method