SJ/T 2658.8-2015
Measuring method for semiconductor infrared-emitting diode.Part 8: Radiant intensity (English Version)

Standard No.

SJ/T 2658.8-2015

Language

Chinese, Available in English version

Release Date

2015

Published By

Professional Standard - Electron

Latest

SJ/T 2658.8-2015

Replace

SJ 2658.8-1986

Scope

This part specifies the measurement principle diagram, measurement steps and specified conditions for the radiation intensity of semiconductor infrared emitting diodes (hereinafter referred to as devices). This section applies to semiconductor infrared emitting diodes.

SJ/T 2658.8-2015 Referenced Document

• CIE 127-1997 Measurement of LEDs
• GB/T 2900.65-2004 Electrotechnical terminology-Lighting
• SJ/T 2658.1 Measuring method for semiconductor infrared-emitting diode.Part 1: General

SJ/T 2658.8-2015 history

• 2015 SJ/T 2658.8-2015 Measuring method for semiconductor infrared-emitting diode.Part 8: Radiant intensity
• 1970 SJ 2658.8-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance

SJ/T 2658.8-2015 Measuring method for semiconductor infrared-emitting diode.Part 8: Radiant intensity has been changed from SJ 2658.8-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance.