BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
- Standard No.
- BS EN IEC 60749-12:2018
- Release Date
- 2018
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN IEC 60749-12:2018
- Replace
- BS EN 60749-12:2002
BS EN IEC 60749-12:2018 Referenced Document
- EN 60068-2-6 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
- IEC 60068-2-6 Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
BS EN IEC 60749-12:2018 history
- 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
- 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
- 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
- 0000 BS 6493-3:1986
BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency has been changed from BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency.
