This standard specifies the terms and definitions, instruments, test procedures and quantitative analysis methods for the determination of phase content of silicon nitride materials by X-ray polycrystalline diffraction. This standard is applicable to the quantitative analysis of a phase and β phase in silicon nitride. In the case where a crystalline phase or amorphous phase other than these two phases is contained, only the relative mass percentage of the α phase and β phase is analyzed. This standard does not apply when the α phase or β phase content is ≤1%.
JC/T 2342-2015 Referenced Document
GB/T 17991 Fine ceramics(advanced ceramics,advanced technical ceramics).Vocabulary
GB/T 8170 Rules of rounding off for numerical values & expression and judgement of limiting values
JY/T 009 General Principles of Rotating Target Polycrystal X-ray Derivation Method
JC/T 2342-2015 history
2015JC/T 2342-2015 Method for the quantitative phase analysis of silicon nitride