BS EN 60444-8:2017
Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
- Standard No.
- BS EN 60444-8:2017
- Release Date
- 2017
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 60444-8:2017
- Replace
- BS EN 60444-8:2003
BS EN 60444-8:2017 Referenced Document
- EN 60444-2 Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
- EN 61837 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
- IEC 61837 Surface mounted piezoelectric devices for frequency control and election - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
BS EN 60444-8:2017 history
- 2017 BS EN 60444-8:2017 Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
- 2003 BS EN 60444-8:2003 Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
