KS C IEC 62047-22:2016
Semiconductor devices ― Micro-electromechanical devices ― Part 18: Bend testing methods of thin film materials

Standard No.

KS C IEC 62047-22:2016

Release Date

2016

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 62047-22-2016(2021)

Latest

KS C IEC 62047-22-2016(2021)

KS C IEC 62047-22:2016 history

• 0000 KS C IEC 62047-22-2016(2021)
• 2016 KS C IEC 62047-22:2016 Semiconductor devices ― Micro-electromechanical devices ― Part 18: Bend testing methods of thin film materials