JEDEC JEP163-2015
Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
- Standard No.
- JEDEC JEP163-2015
- Release Date
- 2015
- Published By
- (U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- Latest
- JEDEC JEP163-2015
JEDEC JEP163-2015 history
- 2015 JEDEC JEP163-2015 Selection of Burn-In/Life Test Conditions and Critical Parameters for QML Microcircuits
