IEC 60147-4:1976
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 4 : Acceptance and reliability

Standard No.

IEC 60147-4:1976

Release Date

1976

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Latest

IEC 60147-4:1976

Replace By

IEC 60747-2:1983 IEC 60747-6:1983 IEC 60747-1:1983

IEC 60147-4:1976 history

• 1976 IEC 60147-4:1976 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 4 : Acceptance and reliability

IEC 60147-4:1976 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 4 : Acceptance and reliability was changed to IEC 60747-2:1983 Semiconductor devices. Discrete devices. Part 2 : Rectifier diodes.

IEC 60147-4:1976 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 4 : Acceptance and reliability was changed to IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors.

IEC 60147-4:1976 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 4 : Acceptance and reliability was changed to IEC 60747-1:1983 Semiconductor devices. Discrete devices. Part 1 : General.