GB/T 13974-1992
Test methods for semiconductor deviece curve tracers (English Version)

Standard No.

GB/T 13974-1992

Language

Chinese, Available in English version

Release Date

1992

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Status

Be replaced 2013-06

Replace By

GB/T 13973-2012

Latest

GB/T 13973-2012

Scope

This standard specifies the test method and error calculation of the semiconductor tube characteristic grapher (hereinafter referred to as the grapher). The terms used in this standard comply with the provisions of Chapter III of GB/T13973 "General Technical Conditions for Semiconductor Tube Characteristic Traverser". This standard is suitable for testing the performance characteristics specified in GB/T13973.

GB/T 13974-1992 history

• 2012 GB/T 13973-2012 General specification test methods for semiconductor device curve tracers
• 1992 GB/T 13974-1992 Test methods for semiconductor deviece curve tracers

GB/T 13974-1992 Test methods for semiconductor deviece curve tracers was changed to GB/T 13973-2012 General specification test methods for semiconductor device curve tracers.