IEC 60147-3:1970
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 3 : Reference methods of measurement

Standard No.

IEC 60147-3:1970

Release Date

1970

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Latest

IEC 60147-3:1970

Replace By

IEC 60747-2:1983 IEC 60747-1:1983 IEC 60747-6:1983

IEC 60147-3:1970 history

• 1970 IEC 60147-3:1970 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 3 : Reference methods of measurement

IEC 60147-3:1970 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 3 : Reference methods of measurement was changed to IEC 60747-2:1983 Semiconductor devices. Discrete devices. Part 2 : Rectifier diodes.

IEC 60147-3:1970 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 3 : Reference methods of measurement was changed to IEC 60747-1:1983 Semiconductor devices. Discrete devices. Part 1 : General.

IEC 60147-3:1970 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 3 : Reference methods of measurement was changed to IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors.