General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
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GB/T 14115-1993
Scope
This standard specifies the basic principles of the electrical parameter test method for semiconductor integrated circuit sample/hold amplifiers (hereinafter referred to as devices). This standard applies to the electrical parameter testing of semiconductor integrated circuit sample/hold amplifiers.
GB/T 14115-1993 history
1993GB/T 14115-1993 General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits