IEC 60147-2:1963
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods

Standard No.

IEC 60147-2:1963

Release Date

1963

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Latest

IEC 60147-2:1963

Replace By

IEC 60747-2:1983 IEC 60747-1:1983 IEC 60747-6:1983

IEC 60147-2:1963 history

• 1963 IEC 60147-2:1963 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods

IEC 60147-2:1963 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods was changed to IEC 60747-2:1983 Semiconductor devices. Discrete devices. Part 2 : Rectifier diodes.

IEC 60147-2:1963 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods was changed to IEC 60747-1:1983 Semiconductor devices. Discrete devices. Part 1 : General.

IEC 60147-2:1963 Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Part 2 : General principles of measuring methods was changed to IEC 60747-6:1983 Semiconductor devices. Discrete devices. Part 6 : Thyristors.