GB/T 12636-1990
Stripline test method for complex permittivity of microwave dielectric substrates (English Version)
- Standard No.
- GB/T 12636-1990
- Language
- Chinese, Available in English version
- Release Date
- 1990
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Latest
- GB/T 12636-1990
- Scope
- This standard specifies the stripline test method for the complex dielectric constant of microwave dielectric substrates. This standard is suitable for testing the complex dielectric constant of various substrates (such as plastics, composite materials, ceramics, silicate and other single crystal materials, etc.) at microwave frequencies. Test frequency range: f=1～20GHz Test dielectric constant range: ε’=2～25 Test loss tangent range: tanδe=5×10-4～1×10-2
GB/T 12636-1990 history
- 1990 GB/T 12636-1990 Stripline test method for complex permittivity of microwave dielectric substrates
