YB/T 4462-2015
High purity ferrosilicon.Determination of boron content.Inductively coupled plasma atomic emission spectrometric method (English Version)

Standard No.

YB/T 4462-2015

Language

Chinese, Available in English version

Release Date

2015

Published By

Professional Standard - Ferrous Metallurgy

Latest

YB/T 4462-2015

Scope

This standard specifies the determination of boron content in high-purity ferrosilicon by inductively coupled plasma atomic emission spectrometry (ICP-AES). This standard is applicable to the determination of boron content in high-purity ferrosilicon. Measuring range (mass fraction): 0.001% ~ 0.010%.

YB/T 4462-2015 history

• 2015 YB/T 4462-2015 High purity ferrosilicon.Determination of boron content.Inductively coupled plasma atomic emission spectrometric method