SJ/T 11505-2015
Sapphire single crystal polished wafers specification (English Version)

Standard No.

SJ/T 11505-2015

Language

Chinese, Available in English version

Release Date

2015

Published By

Professional Standard - Electron

Latest

SJ/T 11505-2015

Scope

This standard specifies the technical requirements, test methods, inspection rules, marking, packaging, transportation and storage of sapphire single crystal polished sheets for substrates and infrared detector windows. This standard applies to polished sapphire single crystal wafers grown by the soaking method and Czochralski method. Polished sapphire single crystal wafers grown by other methods can also refer to this standard.

SJ/T 11505-2015 history

• 2015 SJ/T 11505-2015 Sapphire single crystal polished wafers specification