SJ/T 11500-2015
Test method for measuring crystallographic orientation of monocrystalline silicon carbide (English Version)

Standard No.

SJ/T 11500-2015

Language

Chinese, Available in English version

Release Date

2015

Published By

Professional Standard - Electron

Latest

SJ/T 11500-2015

Scope

This standard specifies a method for determining the crystal orientation of silicon carbide single crystals using the X-ray diffraction orientation method. This standard is applicable to the determination of crystal orientation of silicon carbide single crystals with crystal forms 6H and 4H.

SJ/T 11500-2015 history

• 2015 SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide