SJ/T 11499-2015
Test method for measuring electrical properties of monocrystalline silicon carbide (English Version)

Standard No.

SJ/T 11499-2015

Language

Chinese, Available in English version

Release Date

2015

Published By

Professional Standard - Electron

Latest

SJ/T 11499-2015

Scope

This standard specifies the testing methods for the conductivity type, resistivity, mobility, and carrier concentration of silicon carbide crystal materials. This standard is applicable to the electrical performance testing of silicon carbide single crystals with resistivity below 1×10 Ω·cm and crystal forms 6H and 4H in the temperature range of (-263.15~426.85)℃.

SJ/T 11499-2015 history

• 2015 SJ/T 11499-2015 Test method for measuring electrical properties of monocrystalline silicon carbide