SJ/T 11497-2015
Test method for thermal stability testing of gallium arsenide wafers (English Version)

Standard No.

SJ/T 11497-2015

Language

Chinese, Available in English version

Release Date

2015

Published By

Professional Standard - Electron

Latest

SJ/T 11497-2015

Scope

This standard specifies the test method for the thermal stability of semi-insulating gallium arsenide (GaAs) wafers. This standard is applicable to the thermal stability test of semi-insulating gallium arsenide single crystal materials with resistivity in the range of 10Ω·cm~10Ω·cm.

SJ/T 11497-2015 history

• 2015 SJ/T 11497-2015 Test method for thermal stability testing of gallium arsenide wafers