BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates
- Standard No.
- BS EN 62047-22:2014
- Release Date
- 2014
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 62047-22:2014
BS EN 62047-22:2014 Referenced Document
- EN 62047-2:2006 Semiconductor devices Micro-electromechanical devices Part 2: Tensile testing method of thin film materials
- EN 62047-3:2006 Semiconductor devices - Micro-electromechanical devices Part 3: Thin film standard test piece for tensile testing
- EN 62047-8:2011 Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
- EN ISO 527-3:1995 Plastics - Determination of Tensile Properties - Part 3: Test Conditions for Films and Sheets ISO 527-3: 1995; Incorporating Technical corrigenda June 1998 and April 2001
- ISO 527-3:1995 Plastics - Determination of tensile properties - Part 3: Test conditions for films and sheets
BS EN 62047-22:2014 history
- 2014 BS EN 62047-22:2014 Semiconductor devices. Micro-electromechanical devices. Electromechanical tensile test method for conductive thin films on flexible substrates
