KS C IEC PAS 62162:2002
Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components

Standard No.

KS C IEC PAS 62162:2002

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC PAS 62162-2002(2017)

Latest

KS C IEC PAS 62162-2022

Scope

Thin film circuits, surface acoustic wave (SAW) components, photovoltaic components, hybrid integrated circuits (HICs)

KS C IEC PAS 62162:2002 history

• 2022 KS C IEC PAS 62162-2022 Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components
• 0000 KS C IEC PAS 62162-2002(2017)
• 2002 KS C IEC PAS 62162:2002 Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components