KS C IEC 60749-8:2006
Semiconductor devices-Mechanical and climatic test methods-Part 8:Sealing
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KS C IEC 60749-8:2006
Standard No.
KS C IEC 60749-8:2006
Release Date
2006
Published By
Korean Agency for Technology and Standards (KATS)
Status
Be replaced
Replace By
KS C IEC 60749-8-2006(2016)
Latest
KS C IEC 60749-8-2021
Scope
This standard is applicable to semiconductor devices (discrete devices, integrated circuits). The purpose of this test method is to
KS C IEC 60749-8:2006 history
2021
KS C IEC 60749-8-2021
Semiconductor devices-Mechanical and climatic test methods-Part 8:Sealing
0000
KS C IEC 60749-8-2006(2016)
2006
KS C IEC 60749-8:2006
Semiconductor devices-Mechanical and climatic test methods-Part 8:Sealing
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