KS C IEC 60749-6:2004
Semiconductor devices-Mechanical and climatic test methods-Part 6:Storage at high temperature

Standard No.

KS C IEC 60749-6:2004

Release Date

2004

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Replace By

KS C IEC 60749-6:2020

Latest

KS C IEC 60749-6:2020

Scope

This standard specifies that all semiconductor electrical devices can be stored at high temperatures without applying electrical stress.

KS C IEC 60749-6:2004 history

• 2020 KS C IEC 60749-6:2020 Semiconductor devices — Mechanical and climatic test methods — Part 6: Storage at high temperature
• 2004 KS C IEC 60749-6:2004 Semiconductor devices-Mechanical and climatic test methods-Part 6:Storage at high temperature