KS C IEC 60749-34:2006
Semiconductor devices-Mechanical and climatic test methods-Part 34:Power cycling

Standard No.

KS C IEC 60749-34:2006

Release Date

2006

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Replace By

KS C IEC 60749-34:2017

Latest

KS C IEC 60749-34-2022

Scope

This test method measures the power consumption due to cycling of the semiconductor internal die and internal connectors.

KS C IEC 60749-34:2006 history

• 2022 KS C IEC 60749-34-2022 Semiconductor devices－Mechanical and climatic test methods－Part 34：Power cycling
• 2017 KS C IEC 60749-34:2017 Semiconductor devices－Mechanical and climatic test methods－Part 34：Power cycling
• 2006 KS C IEC 60749-34:2006 Semiconductor devices-Mechanical and climatic test methods-Part 34:Power cycling