KS C IEC 60749-31:2006 Semiconductor devices-Mechanical and climatic test methods-Part 31:Flammability of plastic-encapsulated devices(internally induced)
This standard is applicable to semiconductor devices (discrete devices and integrated circuits). The purpose of this test is to
KS C IEC 60749-31:2006 history
2021KS C IEC 60749-31-2021 Semiconductor devices－Mechanical and climatic test methods－Part 31：Flammability of plastic-encapsulated devices(internally induced)
0000 KS C IEC 60749-31-2006(2016)
2006KS C IEC 60749-31:2006 Semiconductor devices-Mechanical and climatic test methods-Part 31:Flammability of plastic-encapsulated devices(internally induced)