KS C IEC 60749-24:2006
Semiconductor devices-Mechanical and climatic test methods-Part 24:Accelerated moisture resistance-Unbiased HAST

Standard No.

KS C IEC 60749-24:2006

Release Date

2006

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Replace By

KS C IEC 60749-24-2006(2016)

Latest

KS C IEC 60749-24-2021

Scope

This standard is intended to evaluate the reliability of non-sealed packaged semiconductor devices in a humid environment.

KS C IEC 60749-24:2006 history

• 2021 KS C IEC 60749-24-2021 Semiconductor devices－Mechanical and climatic test methods－Part 24：Accelerated moisture resistance－Unbiased HAST
• 0000 KS C IEC 60749-24-2006(2016)
• 2006 KS C IEC 60749-24:2006 Semiconductor devices-Mechanical and climatic test methods-Part 24:Accelerated moisture resistance-Unbiased HAST