KS C IEC 60749-23:2006
Semiconductor devices－Mechanical and climatic test methods－Part 23：High temperature operating life

Standard No.

KS C IEC 60749-23:2006

Release Date

2006

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-23-2006(2016)

Latest

KS C IEC 60749-23:2021

Scope

This test determines how bias conditions and temperature affect solid-state devices over time.

KS C IEC 60749-23:2006 history

• 2021 KS C IEC 60749-23:2021 Semiconductor devices — Mechanical and climatic test methods — Part 23: High temperature operating life
• 0000 KS C IEC 60749-23-2006(2016)
• 2006 KS C IEC 60749-23:2006 Semiconductor devices－Mechanical and climatic test methods－Part 23：High temperature operating life