KS C IEC 60749-13:2002
Semiconductor devices-Mechanical and climatic test methods-Part 13:Salt atmosphere

Standard No.

KS C IEC 60749-13:2002

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Replace By

KS C IEC 60749-13:2020

Latest

KS C IEC 60749-13:2020

Scope

This standard specifies salt water environmental testing to determine the corrosion resistance of semiconductor devices.

KS C IEC 60749-13:2002 history

• 2020 KS C IEC 60749-13:2020 Semiconductor devices — Mechanical and climatic test methods — Part 13: Salt atmosphere
• 2002 KS C IEC 60749-13:2002 Semiconductor devices-Mechanical and climatic test methods-Part 13:Salt atmosphere