KS C IEC 60749-1:2006
Semiconductor devices－Mechanical and climatic test methods－Part 1：General

Standard No.

KS C IEC 60749-1:2006

Release Date

2006

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS C IEC 60749-1-2006(2016)

Latest

KS C IEC 60749-1-2021

Scope

This standard is applicable to semiconductor devices (discrete devices and integrated circuits) and follows IEC 60749 series.

KS C IEC 60749-1:2006 history

• 2021 KS C IEC 60749-1-2021 Semiconductor devices－Mechanical and climatic test methods－Part 1：General
• 0000 KS C IEC 60749-1-2006(2016)
• 2006 KS C IEC 60749-1:2006 Semiconductor devices－Mechanical and climatic test methods－Part 1：General