KS C 6049-1980
Environmental Testing Methods and Endurance Testing Methods for Semiconductor Integrated Circuits

Standard No.

KS C 6049-1980

Release Date

1980

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced 2020-01

Replace By

KS C 6049-2020

Latest

KS C 6049-2020

Scope

This standard covers the use of integrated circuits (excluding hybrid integrated circuits) mainly used in industrial and consumer electronic devices.

KS C 6049-1980 history

• 2020 KS C 6049-2020 Environmental Testing Methods and Endurance Testing Methods for Semiconductor Integrated Circuits
• 1980 KS C 6049-1980 Environmental Testing Methods and Endurance Testing Methods for Semiconductor Integrated Circuits