This standard specifies a test method to determine the damage threshold (LIDT) of the surface of an optical device for induced single shot laser radiation. The test procedure is applicable to all combinations of different laser wavelengths and pulse lengths. However, there is a risk of error in comparing laser damage threshold data without measurements under the same wavelength, pulse length, and beam diameter. Application of this standard is potentially limited to irreparable damage to the surface of photonic devices.
KS B ISO 11254-1:2013 history
2020KS B ISO 11254-1-2020 Lasers and laser ― related equipment ― Determination of laser ― induced damage threshold of optical surfaces ― Part 1: 1-on-1 test
2015KS B ISO 11254-1:2015 Lasers and laser ― related equipment ― Determination of laser ― induced damage threshold of optical surfaces ― Part 1: 1-on-1 test
2013KS B ISO 11254-1:2013 Lasers and laser-related equipment ?; Determination of laser-induced damage threshold of optical surfaces ?; Part 1: 1-on-1 test
2003KS B ISO 11254-1:2003 Laser and laser-related equipment-Determination of laser-induced damage threshold of optical surfaces-Part 1:1-on-1 test