BS PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method

Standard No.

BS PD IEC/TS 62132-9:2014

Release Date

2014

Published By

British Standards Institution (BSI)

Latest

BS PD IEC/TS 62132-9:2014

BS PD IEC/TS 62132-9:2014 Referenced Document

• IEC 60050 Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 904: Environmental standardization for electrical and electronic products and systems*， 2019-10-17 Update
• IEC 61967-6 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method*， 2023-12-21 Update
• IEC 62132-1 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions*， 2015-10-29 Update
• IEC TR 61967-1-1 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format*， 2015-08-28 Update
• IEC TS 61967-3 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method

BS PD IEC/TS 62132-9:2014 history

• 2014 BS PD IEC/TS 62132-9:2014 Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method