This standard specifies semi-quantitative and qualitative determination methods for the composition of composite bimetallic materials and composite electrical contact materials. This standard is applicable to the determination of the composition of each element (mass fraction >0.1%) in composite bimetallic materials except light elements such as C and O. This standard is applicable to the qualitative determination of composite electrical contact materials and the semi-quantitative analysis of main elements. This standard applies to quantitative analysis using X-ray wavelength spectrometers. Its main content and basic principles also apply to X-ray energy spectrometers used in conjunction with scanning electron microscopes.
JB/T 12074-2014 Referenced Document
GB/T 15074 General guide of quantitative analysis by EPMA
GB/T 4930 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)*, 2021-05-21 Update
JB/T 12074-2014 history
2014JB/T 12074-2014 Quantitative analysis of composition metal.Electron probe microanalysis