KS D ISO 22489:2012
Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy

Standard No.

KS D ISO 22489:2012

Release Date

2012

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS D ISO 22489:2018

Latest

KS D ISO 22489-2023

Scope

This standard covers wavelength-dispersive spectrometry (W) coupled to an electron probe microanalyzer or scanning electron microscope (SEM).

KS D ISO 22489:2012 history

• 2023 KS D ISO 22489-2023 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
• 2018 KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
• 2012 KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy