KS X ISO 6342:2007
Micrographics－Aperture cards－Method of measuring thickness of buildup area

Standard No.

KS X ISO 6342:2007

Release Date

2007

Published By

Korean Agency for Technology and Standards (KATS)

Status

Be replaced

Replace By

KS X ISO 6342-2007(2017)

Latest

KS X ISO 6342-2022

Replace

KS X ISO 6342:2004

Scope

This specification measures the thickness of the buildup area of gap cards for manufacturing and inspection purposes.

KS X ISO 6342:2007 history

• 2022 KS X ISO 6342-2022 Micrographics－Aperture cards－Method of measuring thickness of buildup area
• 0000 KS X ISO 6342-2007(2017)
• 2007 KS X ISO 6342:2007 Micrographics－Aperture cards－Method of measuring thickness of buildup area
• 0000 KS X ISO 6342:2004

KS X ISO 6342:2007 Micrographics－Aperture cards－Method of measuring thickness of buildup area was changed to BS PD CEN/TS 16675:2018 Waste. Test methods for the determination of the monolithic status of waste to be landfilled.